We are thrilled to announce that Dr. Meikei Ieong, Chairman of Simbury, has been awarded the top honour of “2023 VLSI Test of Time Award” at the Symposium on VSL Technology and Circuits on 14 June 2023.

The Very Large-Scale Integration (VLSI) Symposium is an international conference on semiconductor technology and circuits that offers an opportunity to interact and synergize on topics spanning the range from process technology to system-on-chip.

The VLSI Test of Time Award is a prestigious recognition in the field of VLSI design and testing. This award is given annually by the Institute of Electrical and Electronics Engineers (IEEE) to acknowledge outstanding research contributions that have had significant impact on the VLSI community.

The award recognizes Dr. Ieong for his outstanding contributions on optimizing the CMOS process technique indicates in his paper “Monte Carlo modeling of threshold variation due to dopant fluctuations” (co-author with Professor Philip Wong) which made a great impact to the global semiconductor industry, cementing his status as a leading innovator in the society.

“I am deeply honoured to receive the VLSI Test of Time Award this year,” said Dr. Ieong. “I am grateful for the recognition of our paper which has been published over 20 years, and the opportunity to share our insights with the broader community.  I look forward to continuing to contribute to the field of VLSI design and testing globally.”

This premier event in the industry brings together some of the brightest minds and most innovative companies from around the world. The fact that Dr. Ieong was selected for this top honour speaks volumes about his expertise and influence in the industry.